ModFlash HT Si | Solar testing
This system is based on a completely new vision and measurement method. We are able to realize attributes like sunny side down testing, auto contacting, inline capability and auto labelling in just one compact and highly sophisticated machine solution.
Automated IV-Curve Tester for flat panel Si modules
Small footprint
Accuracy of measurements: ±1,5%
Very high homogeneity of surface
Very high spectral match
Lamp type Xenon Flash
Type of measurement: single Flash
Short term stability of irradiance (IEC 60904-9) < ±2,0%
Non uniformity of irradiance (IEC 60904-9): < ±2,0%
Max. illuminated area: 1.650mm x 1x400mm
Voltage range: 0V - 50V
Current range: 0A - 8A
Duration of IV measurement: 10 ms
Max. module measurements per hour: 60
